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High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes
SJR: 0.137 SNIP: 0.341 CiteScore™: 0.43

ISSN Печать: 1093-3611
ISSN Онлайн: 1940-4360

Выпуски:
Том 23, 2019 Том 22, 2018 Том 21, 2017 Том 20, 2016 Том 19, 2015 Том 18, 2014 Том 17, 2013 Том 16, 2012 Том 15, 2011 Том 14, 2010 Том 13, 2009 Том 12, 2008 Том 11, 2007 Том 10, 2006 Том 9, 2005 Том 8, 2004 Том 7, 2003 Том 6, 2002 Том 5, 2001 Том 4, 2000 Том 3, 1999 Том 2, 1998 Том 1, 1997

High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes

DOI: 10.1615/HighTempMatProc.v1.i4.80
pages 493-509

TEMPERATURE DETERMINATION USING MOLECULAR SPECTRA SIMULATION

Stephane Pellerin
GREMI, CNRS-Universite d'Orleans, BP 6759, 45067 Orleans Cedex 2, France LASEP, Universite d'Orleans - Antenne de Bourges, BP4043, 18028 Bourges, France
J. Koulidiati
Laboratoire de Physique et Chimie de l'Environnement, Université de Ouagadougou, Burkina Faso
O. Motret
GREMI, UMR 6606, Universite d'Orleans, B.P. 6759, 45067 Orleans Cedex 2, France
K. Musiol
Marian Smoluchowski Inst. of Physics, Jagellonian University, ul. Reymonta 4,30-459 Krakow, Poland
M. De Graaf
Laboratoire d'Aerothermique du CNRS 4ter Route des Gardes, 92190 Meudon, France
B. Pokrzywka
Mt.Suhora, Observatory of Cracow Pedagogical University, ul. Podchorazych 2, 30-084, Krakow, Poland
J. Chapelle
LASEP, Centre Universitaire de Bourges, Rue Gaston Berger, BP 4043, 18028 Bourges Cedex, France

Краткое описание

Noisy and spectrally not well resolved molecular emission spectra were employed for evaluation of the rotational and vibration temperature in different plasma sources. This diagnostic method may be applied in a large temperature range. It is especially useful when the apparatus function of a recording system is unknown. The described method is based on a comparison of experimental data with a theoretically calculated spectrum. A numerical minimization procedure is started with the temperature value obtained from the Boltzmann plot or intensity ratio of two selected spectrum components. Examples are given with C2(d3Πg,ν'=0) → C2(a3Πu,ν"=0) Swan band at 516.611 nm, OH (А2Σ+,ν’=0)→ OH(X2Πν''=0) band at 306.357 nm, and CH(А2Δ-Х2Π) system around 431.5 nm.