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Thermal Sciences 2004. Proceedings of the ASME - ZSIS International Thermal Science Seminar II
June, 13-16, 2004, Bled, Slovenia

DOI: 10.1615/ICHMT.2004.IntThermSciSemin


ISBN Print: 978-9-61913-930-1

Temperature and Pressure Measurements using Oxygen Fluorescence

pages 253-258
DOI: 10.1615/ICHMT.2004.IntThermSciSemin.260
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ABSTRACT

A method for the measurement of temperature and pressure using oxygen fluorescence for eventual use aboard an aircraft is presented. A xenon flashlamp is used to excite oxygen molecules with photons of wavelengths from 185 to 200nm. Large windows of detection (100nm and 65nm) are used to reduce the fluctuations in the total measured fluorescence caused by predissociation and quantum noise. Temperature and pressure are correlated with fluorescence ratio. The resulting error in temperature and pressure is found to depend on the number of averaged samples. A typical error for a flash rate of 60Hz is ±3° C for temperatures from −22 to 44° C and ±0.06 atm for pressures from 0.5 to 2.0 atm.

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