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Atomization and Sprays
Fator do impacto: 1.737 FI de cinco anos: 1.518 SJR: 0.814 SNIP: 1.18 CiteScore™: 2.2

ISSN Imprimir: 1044-5110
ISSN On-line: 1936-2684

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Atomization and Sprays

DOI: 10.1615/AtomizSpr.v2.i4.20
pages 385-409

ACCOUNTING FOR DEPTH OF FIELD IN SIZING SPHERICAL PARTICLES BY IMAGING

Douglas Talley
USAF Research Lab, CA, USA
M. Hassani
Department of Mechanical Engineering and Applied Mechanics, The University of Michigan, Ann Arbor, Michigan, 48109

RESUMO

A general approach to correcting for depth-of-field effects in sizing spherical particles by imaging is presented, and shown to reduce to two other well-known but heretofore apparently unrelated methods as special cases. The approach is adaptable to a wide variety of conditions by means of functions that are measured during calibration. Most generally, correcting for depth-of-field effects requires traversing the object plane through the particle field. However, conditions are identified that allow proper corrections to be made without having to move the object plane. The dynamic range of an instrument as a function of distance from the object plane, or the dynamic envelope, measured during calibration will not necessarily be the same as the one actually realized in measurement, which can be significantly different. This must be taken into account as part of the measurement process.


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