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High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes

Publicou 4 edições por ano

ISSN Imprimir: 1093-3611

ISSN On-line: 1940-4360

The Impact Factor measures the average number of citations received in a particular year by papers published in the journal during the two preceding years. 2017 Journal Citation Reports (Clarivate Analytics, 2018) IF: 0.4 The Immediacy Index is the average number of times an article is cited in the year it is published. The journal Immediacy Index indicates how quickly articles in a journal are cited. Immediacy Index: 0.1 The Eigenfactor score, developed by Jevin West and Carl Bergstrom at the University of Washington, is a rating of the total importance of a scientific journal. Journals are rated according to the number of incoming citations, with citations from highly ranked journals weighted to make a larger contribution to the eigenfactor than those from poorly ranked journals. Eigenfactor: 0.00005 The Journal Citation Indicator (JCI) is a single measurement of the field-normalized citation impact of journals in the Web of Science Core Collection across disciplines. The key words here are that the metric is normalized and cross-disciplinary. JCI: 0.07 SJR: 0.198 SNIP: 0.48 CiteScore™:: 1.1 H-Index: 20

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PASSIVATION OF POLYCRYSTALLINE SILICON BY HYDROGEN PLASMA : CHARACTERIZATION BY IMPEDANCE SPECTROSCOPY

Volume 9, Edição 2, 2005, pp. 269-277
DOI: 10.1615/HighTempMatProc.v9.i2.90
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RESUMO

Hydrogenation of silicon materials has attracted a great advantage for its photovoltaic properties. In this paper, we investigated the effects of hydrogen plasma treatment on the structure and properties of silicon surface. The electrical conductivity is measured before and after plasma exposure by impedance spectroscopy on solid indicating a promising method. We observed a strong dependence between measurements and operational conditions (temperature, atmosphere, ...). SIMS, and deuterium effusion are used in order to confirm the impedance measurements. The surface roughness is also evaluated by AFM.

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