Início > Autores, editores e revisores da Begell House
L. Raniero
Instituto Nacional de Metrologia, Normalização e Qualidade Industrial-Divisão de Metrologia de Materiais, Av. Nossa Senhora das Graças, 50 - Prédio 3 - Dimci/Dimat, 25250-020 Xerém - Duque de Caxias - RJ
Articles:
DIFFERENCES BETWEEN AMORPHOUS AND NANOSTRUCTURED SILICON FILMS AND THEIR APPLICATION IN SOLAR CELL - Vol. 11 '2007 - High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes
SPECTRAL RESPONSE OF LARGE AREA AMORPHOUS SILICON SOLAR CELLS - Vol. 8 '2004 - High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes