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Radio Physics and Radio Astronomy

ISSN 印刷: 2152-274X
ISSN オンライン: 2152-2758

Archives: Volume 1, 2010 to Volume 3, 2012

Radio Physics and Radio Astronomy

DOI: 10.1615/RadioPhysicsRadioAstronomy.v2.i1.50
pages 47-62

DETERMINATION OF LAYERED STRUCTURE PARAMETERS BY A SCATTERING MATRIX RECOVERED FROM KNOWN REFLECTION COEFFICIENTS

Z. T. Nazarchuk
Karpenko Physical-Mechanical Institute, National Academy of Sciences of Ukraine
A. T. Synyavskyy
Karpenko Physico-Mechanical Institute, National Academy of Sciences of Ukraine

要約

A new method for determining both layers' permittivity and thickness of a plane layered structure is proposed. The reflection coefficient of a plane electromagnetic wave is considered as the problem's given data. The method employs an approach to reconstruction of the frequency dependences of all scattering matrix elements in a limited waveband. The scattering matrix has been recovered by recalculation of the reflection coefficients measured for this structure in free space and on a perfectly-conducting substrate. A high accuracy in both permittivity and thickness determination is achieved due to identification of spectral factors which are singled out from the scattering matrix elements and expressed as a finite series of continuous complex exponents.


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