年間 12 号発行
ISSN 印刷: 0040-2508
ISSN オンライン: 1943-6009
Indexed in
Statistical Errors of Ranging in the Spectral Interferometry Technique
要約
Statistical errors of measuring the distance to a reflector by the methods of one- and two-dimensional spectral interferometry are determined and analyzed, both with and without account of the intrinsic noise of the meter. The statistical errors are analyzed in dependence on the reference-to-echo signal ratio, as well as on the signal-to-noise ratio for spectral densities at the meter output. Relations have been obtained for estimating the potential measurement accuracy for both methods. It has been shown that the measurement errors are determined by the normalized standard error of the spectral density estimate. The ranging accuracy provided by the two-dimensional spectral interferometry has been found to greatly exceed that of the one-dimensional spectral interferometry technique. This makes it possible to use the former method for precision range measurements.
-
Lukin Konstantin A., Tatyanko Dmytro N., Zemlyaniy Oleg V., Pikh Alona B., Noise waveform reflectometer based on LED and spectral interferometry technique, 2017 Signal Processing Symposium (SPSympo), 2017. Crossref
-
Lukin K. A., Tatyanko D. N., Shiyan Y. A., Yurchenko L. V., Bazakutsa A. V., Optical reflectometer based on the method of spectral interferometry, RADIOFIZIKA I ELEKTRONIKA, 20, 2, 2015. Crossref