年間 12 号発行
ISSN 印刷: 0040-2508
ISSN オンライン: 1943-6009
Indexed in
Microwave Reflectivity of HTS Film - Dielectric Substrate Structure at Arbitrary Incidence Angles
要約
Microwave reflectivity properties of HTS film - dielectric substrate structure in the framework of «optical» terminology for millimeter waveband have been studied by means of computer modeling. For this purpose the enhanced two-fluid model of HTS microwave properties is applied. Some peculiar features in the reflection coefficient of the p-polarized waves obliquely incident on the sample are observed, and difference between the values of the reflectivity in S- and N-states is calculated. For thin HTS films (thickness < λL) the non-monotonic dependences of the reflectivity versus both temperature and the incidence angle (in N-state) are observed. For thick films (thickness > λL) the difference enhancement factor can be as much as 25 at the incidence angle of 88°. To perform the simulation, the material parameters of YBa2Cu3O7−δ superconductor and LaAlO3 substrate in the frequency range of 40-160 GHz have been used.
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Gubin A.I., Cherpak N.T., Lavrinovich A.A., MM Wave Conductivity Measurement Technique by Grazing Incidence Reflectivity, 2008 38th European Microwave Conference, 2008. Crossref
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Gubin A.I., Cherpak N.T., Lavrinovich A.A., Grazing Incidence Reflectivity of High-Tc Superconductors: MM Wave Technique, a New Approach to Study and First Results, 2007 International Kharkiv Symposium Physics and Engrg. of Millimeter and Sub-Millimeter Waves (MSMW), 2007. Crossref
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Gubin A. I., Vitusevich S. A., Submm-Wave Reflection and Transmission Technique for Testing and Monitoring of Biochemical Solutions, in THz for CBRN and Explosives Detection and Diagnosis, 2017. Crossref