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Telecommunications and Radio Engineering
SJR: 0.203 SNIP: 0.44 CiteScore™: 1

ISSN 印刷: 0040-2508
ISSN オンライン: 1943-6009

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Telecommunications and Radio Engineering

DOI: 10.1615/TelecomRadEng.v60.i56.150
7 pages

Accuracy and Sensitivity of Surface Resistance Measurements of High-Temperature Superconductor Films Using Quasioptical Dielectric Resonators

A. A. Barannik
O.Ya. Usikov Institute for Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12, Academician Proskura St., Kharkiv 61085, Ukraine
S. A. Bunyaev
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine, 12, Academician Proskura St., Kharkov 61085, Ukraine
Nikolay T. Cherpak
O.Ya. Usikov Institute for Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12, Academician Proskura St., Kharkiv 61085, Ukraine

要約

The most probable measurement error analysis of the surface resistance Rs of high-temperature superconductor (HTS) films using quasioptical dielectric resonators has been carried out depending on the resonator main operating characteristics and dielectric properties. It has been shown that using the quasioptical dielectric resonator made of single crystal leukosapphire one can achieve the extremely low values of the measurement error and the most high measurement sensitivity of the surface resistance Rs at low temperatures. Numerical evaluations are presented for the 8-mm wavelength range. In partially, the minimal measurable value Rsmin (Rsmin < 1 μΩ at T < 4.2 K) based on the sapphire single crystal properties and operating characteristics of modern microwave network-analyzers has been obtained.


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