Published 12 issues per year
ISSN Print: 1064-2315
ISSN Online: 2163-9337
Indexed in
Simulation Modeling of Devices for Diagnosing the Operative Memory Microchips
ABSTRACT
Mathematical models that are proposed to apply in realization of the immitation simulation of diagnostic devices of high-speed memory microchips are considered. In the process of execution of immitation experiments, one studies sequences of operations and address passages that arise in programs of diagnostic tests being examined.
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Danil'chenko, P. G., Algorutmy i yazyki modelorovaniya vychislitel'nykh ustroistv i sistem. Uchebnoe posobie (Algorithms and languages of modeling of computing devices. Manual).
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Zheliznichenko, A. A., Oleinik, G. T., Ryabtsev, V.G., and Timchenko, A. A., The System of Automated Design of Programs of Test Diagnostics of High Speed Semiconductor Memory Devices.
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Lizogub, R. A., Ryabtsev, V. G., and Saliu, G., Interpreting System for the Automated Design of Programs of Tests.