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ISSN Print: 0040-2508
ISSN Online: 1943-6009
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Microwave Losses in a Quasioptical Dielectric Resonator as a Function of the Thickness of Ultra-Thin Conducting Endplates
ABSTRACT
We report on a large sharp variation (∼103 times) of the quality-factor of a quasioptical dielectric resonator with conducting endplates in the form of ultra-thin copper films as their thickness changes only to ∼0.9 nm. The measurements have been carried out in the 8-mm waveband at room temperature. An explanation of the effect is represented based on both the microwave properties of the resonator with a film and the dependence of continuity of ultra-thin copper films on the thickness.
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Cherpak N.T., Barannik A.A., Bunyaev S.A., Quasi-optical sapphire resonators for millimeter wave impedance characterization of high-T<inf>C</inf> superconducting thin films, 2008 Microwaves, Radar and Remote Sensing Symposium, 2008. Crossref
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Cherpak N. T., Barannik A. A., Bunyaev S. A., Quasi-Optical Dielectric Resonator-Based Technique of HTS Film Millimeter-Wave Surface Resistance Measurements: Three Types of Resonators, 2008 38th European Microwave Conference, 2008. Crossref
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Barannik A. A., Cherpak N. T., Protsenko I. A., Gubin A. I., Kireev D., Vitusevich S., Contactless exploration of graphene properties using millimeter wave response of WGM resonator, Applied Physics Letters, 113, 9, 2018. Crossref
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Barannik Alexander A., Cherpak Nickolay T., Protsenko Irina A., Vitusevich Svetlana A., Millimeter-Wave WGM Resonator-Based Characterization of Continuous and Noncontinuous Ultrathin Cu Films, IEEE Microwave and Wireless Components Letters, 29, 5, 2019. Crossref