RT Journal Article
ID 032f666c6b623e59
A1 Malureanu, Emilia-Simona 
A1 Andrei, Mihail-Iulian 
A1 loan, Daniel 
A1 Dan, Daniel 
T1 NUMERICAL MULTISCALE MODELING OF THE METAL-INSULATOR-METAL STRUCTURES
JF International Journal for Multiscale Computational Engineering
JO JMC
YR 2015
FD 2015-08-28
VO 13
IS 4
SP 321
OP 337
K1 MIM junctions
K1 field electron emission
K1 tunneling current
AB Accurate data about electric field on the metalinsulator interface are essential for a series of phenomena, such as electric breakdown, corona discharges, or electron emission. As the size of the structures used in electronics industry goes toward nanoscopic scale, the sharp edge electrostatic effect in these structures becomes more predominant and a correct estimation of the electric field intensity value implies using combined numerical and analytical methods. The implications of the theoretical obtained results are analyzed by considering experimental data.
PB Begell House
LK https://www.dl.begellhouse.com/journals/61fd1b191cf7e96f,32d4c3584dd9b192,032f666c6b623e59.html