%0 Journal Article %A Timchenko, A. A. %A Ryabtsev, V. G. %A Lizogub, R. A. %A Saliu, J. A. %D 1998 %I Begell House %N 4-5 %P 79-85 %R 10.1615/JAutomatInfScien.v30.i4-5.90 %T Simulation Modeling of Devices for Diagnosing the Operative Memory Microchips %U https://www.dl.begellhouse.com/journals/2b6239406278e43e,573e6fed09bf9833,3fcb6be24e7d2d95.html %V 30 %X Mathematical models that are proposed to apply in realization of the immitation simulation of diagnostic devices of high-speed memory microchips are considered. In the process of execution of immitation experiments, one studies sequences of operations and address passages that arise in programs of diagnostic tests being examined. %8 1998-10-01