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Journal of Automation and Information Sciences
SJR: 0.275 SNIP: 0.59 CiteScore™: 0.8

ISSN Imprimir: 1064-2315
ISSN En Línea: 2163-9337

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Journal of Automation and Information Sciences

DOI: 10.1615/JAutomatInfScien.v30.i4-5.90
pages 79-85

Simulation Modeling of Devices for Diagnosing the Operative Memory Microchips

A. A. Timchenko
Cherckassy Engineering Techological Institute, Cherkassy
V. G. Ryabtsev
Cherckassy Engineering Techological Institute, Cherkassy
R. A. Lizogub
Cherckassy Engineering Techological Institute, Cherkassy
J. A. Saliu
Cherckassy Engineering Techological Institute, Cherkassy

SINOPSIS

Mathematical models that are proposed to apply in realization of the immitation simulation of diagnostic devices of high-speed memory microchips are considered. In the process of execution of immitation experiments, one studies sequences of operations and address passages that arise in programs of diagnostic tests being examined.

REFERENCIAS

  1. Danil'chenko, P. G., Algorutmy i yazyki modelorovaniya vychislitel'nykh ustroistv i sistem. Uchebnoe posobie (Algorithms and languages of modeling of computing devices. Manual).

  2. Zheliznichenko, A. A., Oleinik, G. T., Ryabtsev, V.G., and Timchenko, A. A., The System of Automated Design of Programs of Test Diagnostics of High Speed Semiconductor Memory Devices.

  3. Lizogub, R. A., Ryabtsev, V. G., and Saliu, G., Interpreting System for the Automated Design of Programs of Tests.


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