Inicio > Autores, Editores y Críticos de Begell House
V. V. Orlov
National Research Nuclear University MEPhI, 31 Kashirskoye Highway, Moscow, 115409, Russia
Articles:
SIMULATION OF THE INTERDEVICE LEAKAGE CURRENT UNDERNEATH THICK ISOLATION OXIDES IN CMOS FPGAS - Vol. 21 '2017 - High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes