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High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes

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ISSN Druckformat: 1093-3611

ISSN Online: 1940-4360

The Impact Factor measures the average number of citations received in a particular year by papers published in the journal during the two preceding years. 2017 Journal Citation Reports (Clarivate Analytics, 2018) IF: 0.4 The Immediacy Index is the average number of times an article is cited in the year it is published. The journal Immediacy Index indicates how quickly articles in a journal are cited. Immediacy Index: 0.1 The Eigenfactor score, developed by Jevin West and Carl Bergstrom at the University of Washington, is a rating of the total importance of a scientific journal. Journals are rated according to the number of incoming citations, with citations from highly ranked journals weighted to make a larger contribution to the eigenfactor than those from poorly ranked journals. Eigenfactor: 0.00005 The Journal Citation Indicator (JCI) is a single measurement of the field-normalized citation impact of journals in the Web of Science Core Collection across disciplines. The key words here are that the metric is normalized and cross-disciplinary. JCI: 0.07 SJR: 0.198 SNIP: 0.48 CiteScore™:: 1.1 H-Index: 20

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ION-BEAM ASSISTED DEPOSITION EFFECT ON RESIDUAL STRESSES IN 304L STAINLESS STEEL FILMS

Volumen 2, Ausgabe 3, 1998, pp. 431-442
DOI: 10.1615/HighTempMatProc.v2.i3.110
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ABSTRAKT

Improvement of the tribological behaviour of bulk material with a deposited coating on its surface is widely used because it generally provides good results. Nevertheless, the deposition process is often responsible of residual stress generation in the film which may then lead to a degradation of the coated sample. The aim of this work is to show that high compressive stresses existing in a 304L Stainless Steel sputter-deposited coating may be reduced when using ion irradiation during thin film growth. The evolution of the mechanical and microstructural state as a function of ion irradiation have been studied by X-ray diffraction and curvature methods. The results indicate a large decrease of the compressive stress magnitude (about 50%) and an increase of the size of coherently diffracting domains (factor 10) for ion-beam assisted deposition process with respect to the classical one. Furthermore, we observed a large difference (around 1 GPa) for all the samples between the stress level determined by X-ray diffraction and the one related to curvature method. In addition, conversion electron Mossbauer spectroscopy results are closely correlated to the X-ray diffraction ones.

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