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ISSN 打印: 1064-2285

ISSN 在线: 2162-6561

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MODELING EFFECT OF SURFACE OXIDIZATION ON THE NORMAL EMISSIVITY OF RED COPPER T1 AT A WAVELENGTH OF 1.5 μm AND TEMPERATURE RANGE FROM 800 TO 1100 K

卷 50, 册 13, 2019, pp. 1251-1263
DOI: 10.1615/HeatTransRes.2019027800
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摘要

This work endeavors to study the effect of surface oxidization on the normal spectral emissivity of red copper T1 samples at 1.5 μm. The normal emissivity is measured over a temperature range from 800 to 1100 K during a 6-h heating period. The radiance emitted by the specimens is received by an InGaAs photodiode detector, which works at 1.5 μm with a bandwidth of approximately 20 nm. The surface temperature of the specimens is measured by averaging the readings of two thermocouples, which are symmetrically welded at the front surface of the specimens near the measuring area. The strong oscillation of emissivity appears only during the initial heating period at each temperature, which is confirmed to be connected with the thickness of the oxide layer. The interference effect is discussed between the radiation stemming from the oxide layer and the radiation from the underlying metal substrate, which is responsible for the strong oscillation. The uncertainty of emissivity yielded only by the surface oxidization is approximately 2.9% to 14.3%. The temperature uncertainty generated only by the surface oxidization is approximately 2.5 to 8.8 K. The models of normal emissivity with heating time are evaluated at a certain temperature. A simple functional form is found to well reproduce the variation of normal emissivity with heating time, including the reproduction of the strong emissivity oscillation occurring during the initial heating period.

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